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VSL Dutch Metrology Institute uses PI Ceramic Technology

Quantitative determination of microstructure and nanostructure properties is essential in research, development and in control of the production process.

In this paper, we report the development of an explicit force-feedback control system for micro-assembly, focusing on the key issues of force transmission and control.

A traditional photonic-force microscope (PFM) results in huge sets of data, which requires tedious numerical analysis.