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Quantitative determination of microstructure and nanostructure properties is essential in research, development and in control of the production process.

In this paper, we report the development of an explicit force-feedback control system for micro-assembly, focusing on the key issues of force transmission and control.

A traditional photonic-force microscope (PFM) results in huge sets of data, which requires tedious numerical analysis.

VSL Dutch Metrology Institute uses PI Ceramic Technology